Spectral Reflectance Film Thickness Measurement System IoT the press is suitable for

the press is suitable for glove box applications

2W – 10W output options

EPA Method - 202_2 - Aluminum - Atomic Absorption-Graphite Furnace

Universal detector

Spectral Reflectance Film Thickness Measurement System IoT the press is suitable forSpectral Reflectance Technology Precision Film Thickness Measurement Non Contact Nanometer to Micrometer Analysis High precision film thickness measurement based on advanced spectral reflectance technology. Enables accurate, non contact measurement from 5 nm to 250 m across semiconductors, photovoltaics, optical coatings, and biomedical applications. Direct replacement for Filmetrics F20 systems. Request Application Study 0. 1 nm Repeatability 5 nm